An On-Line Calibration Method for TSEP-Based Junction Temperature Estimation

Temperature sensitive electrical parameters (TSEP) provide an indirect and noninvasive method for on-line junction temperature estimation of power semiconductor devices. It is known that the fundamental TSEP-based methods to calibrate relationship between TSEP in advance. However, calibration literature need open module, require pretesting, or record operating data a converter entire rating range, which are inconvenient field applications. This article proposes by measuring at three states already existed regular operation. achieved accessible heatsink/case during The concept, implementation, error analysis proposed presented this article. Experimental verification given prove effectiveness, accuracy, convenience method.